Tektronix AFG31102

2 Channel, 100 MHz, 16 MSa/通道 1 GS/s 14 位元

Twin channel 1µHz to 100MHz Sine frequency range.
Patented InstaView™ technology enables engineers to see the actual waveform at the Device Under Test (DUT) in real time, without the need of an oscilloscope and probe, eliminating the uncertainty caused by mismatched impedance.
Sequencing option adds the ability to program long, complex waveforms with up to 256 steps.
The 9-inch capacitive touch screen works like a smart phone and has short-cuts to frequently used settings.
Built-in ArbBuilder lets you create and edit arbitrary waveforms on the instrument, eliminating the need to connect to a PC.
Outputs are protected from over voltage and current to minimize potential instrument damage.
Built-in Double Pulse Test application to generate voltage pulses with varying pulse widths onto the DUTs.

Tektronix AFG31102 Arbitrary Function Generator 2Ch 100MHz

Basic (AFG)


Run modes:Continuous, Modulation, Sweep and Burst


Standard waveforms: Sine, Square, Pulse, Ramp, More (Noise, DC,Sin(x)/x, Gaussian, Lorentz, Exponential Rise, Exponential Decay, Haversine )


Arbitrary waveforms Sampling clock: 250 MSa/s, 1 GSa/s or 2 GSa/s (model and waveform length apply)


Vertical resolution: 14 bits


Waveform length: 2 to 131,072 points

Frequency range (Sine):

Continuous mode :1 μHz to 100 MHz

Burst mode: 1 μHz to 50 MHz

Frequency range (Square): 1 μHz to 80 MHz

Rise/fall time, typical

Amplitude ≤ 5 Vpp :≤ 3.5 ns

Amplitude > 5 Vpp:≤ 4.2 ns

Frequency range (Ramp) :1 μHz to 1 MHz

Frequency range(Arbitrary waveforms):

Normal :1 mHz to 50 MHz

Burst mode: 1 mHz to 25 MHz